Hasbrouck, Christie; Miller, Simon; Martin, Jay (2026). Appendix to: Computer vision and machine learning techniques for optical micrograph defect classification using a novel gray thresholding technique [Data set]. Scholarsphere. https://doi.org/10.26207/83hq-wr53 content_paste

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Work Title	Appendix to: Computer vision and machine learning techniques for optical micrograph defect classification using a novel gray thresholding technique
Access	Open Access
Creators	C. R. Hasbrouck Simon W. Miller Jay Martin
License	MIT License
Work Type	Software Or Program Code
Publication Date	January 28, 2026
DOI	doi:10.26207/83hq-wr53
Related URLs	https://doi.org/10.1007/s40192-026-00474-1
Deposited	January 28, 2026

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