Sample handling, preparation and mounting for XPS and other surface analytical techniques

Sample preparation and mounting are important aspects of x-ray photoelectron spectroscopy (XPS) analysis. New users do not know many techniques that are familiar to analysts with years of experience, and these observations and “tricks of the trade” are typically not published. This article is intended to convey the experience of the authors in this field who have creatively analyzed a wide range of samples. Samples can include solids, powders, fibers, porous solids, and even liquids. This information is also important to anyone submitting samples for analysis, since the preparation of the sample may influence the usefulness of the data collected. These techniques are also applicable to other surface analysis methods.

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Work Title Sample handling, preparation and mounting for XPS and other surface analytical techniques
Access
Open Access
Creators
  1. Jeffrey Shallenberger
Keyword
  1. sample preparation
  2. XPS
License CC BY 4.0 (Attribution)
Work Type Article
Acknowledgments
  1. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Journal of Vacuum Science and Technology A and may be found at doi.org/10.1116/6.0000421.
Publication Date September 11, 2020
Publisher Identifier (DOI)
  1. doi.org/10.1116/6.0000421
Deposited March 02, 2021

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  • Added Creator Jeffrey Shallenberger
  • Added Sample handling, preparation and mounting for XPS and other surface analytical techniques.pdf
  • Updated Acknowledgments, License Show Changes
    Acknowledgments
    • This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Journal of Vacuum Science and Technology A and may be found at doi.org/10.1116/6.0000421.
    License
    • https://creativecommons.org/licenses/by/4.0/
  • Published
  • Updated
  • Updated