Analytical modeling of k_33 mode partial electrode configuration for loss characterization

Accurate determination of three types of losses (dielectric, elastic, and piezoelectric) in piezoelectric materials is critical, since they are closely related to the performance of high-power piezoelectric devices. The standard k33 mode has a number of serious deficits that hinder researchers from determining accurate physical parameters and losses. In order to overcome such deficits, “partial electrode” has been devised and proposed. This study provides an analytical derivation process and proposes a parameter determination method by utilizing analytical solutions. Compared to finite element analysis, analytical solutions show a 0.1% difference in resonance frequencies and a 2% difference in mechanical quality factors, proving themselves as valid modeling. The analytical solutions are fitted to experimental data to determine physical parameters and losses. The k33 (electromechanical coupling factor) values were calculated with determined values from curve fitting in two different ways and show good agreement to each other.

This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in [Analytical modeling of k_33 mode partial electrode configuration for loss characterization. Journal of Applied Physics 127, 20 p204102 (2020)] and may be found at https://doi.org/10.1063/1.5143728.

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Work Title Analytical modeling of k_33 mode partial electrode configuration for loss characterization
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Open Access
Creators
  1. Yoonsang Park
  2. Maryam Majzoubi
  3. Yuxuan Zhang
  4. Timo Scholehwar
  5. Eberhard Hennig
  6. Kenji Uchino
License In Copyright (Rights Reserved)
Work Type Article
Publisher
  1. Journal of Applied Physics
Publication Date May 10, 2020
Publisher Identifier (DOI)
  1. 10.1063/1.5143728
Deposited April 27, 2022

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  • Added Creator Yoonsang Park
  • Added Creator Maryam Majzoubi
  • Added Creator Yuxuan Zhang
  • Added Creator Timo Scholehwar
  • Added Creator Eberhard Hennig
  • Added Creator Kenji Uchino
  • Added 20-k33PE-Analytical-Park-JAP-2020-1 (1).pdf
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