A Study of PyTorch Bug Patterns and Memory-Related Challenges

This study presents an in-depth manual analysis of memory-related bugs within the PyTorch deep learning framework, leveraging a filtered dataset of 1,678 closed issues from the official PyTorch GitHub repository. The selected issues span a three-year period from January 1, 2020, to March 23, 2023, allowing for a comprehensive examination of trends, patterns, and solutions. This study aims to understand the correlations between the characteristics of PyTorch bugs and also the composition of the root causes behind memory bugs. The findings reveal that Correctness and Runtime Error bugs occur most frequently, with a lack of a correlation between Affected Components and Bug Symptoms. Our results highlight the need for more integrated inter-component debugging tools. Furthermore, the findings show that indexing errors occur most frequently among memory bugs. We determine that, to address the severe impact of such memory bugs, there exists a need for more comprehensive and redundant test cases. Through this analysis, this work aims to provide actionable insights for developers to improve the robustness of PyTorch, improving its reliability in machine learning applications.

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Work Title A Study of PyTorch Bug Patterns and Memory-Related Challenges
Access
Open Access
Creators
  1. Brian Yu
  2. Rubayet Rongon
  3. Chen Cao
  4. Xuechen Zhang
License In Copyright (Rights Reserved)
Work Type Article
Publisher
  1. 2024 National Symposium for NSF REU Research in Data Science, Systems, and Security (REU 2024 Symposium)
Publication Date December 15, 2024
Publisher Identifier (DOI)
  1. https://doi.org/10.1109/BigData62323.2024.10824945
Deposited May 22, 2025

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  • Added Creator Rubayet Rongon
  • Added Creator Chen Cao
  • Added Creator Xuechen Zhang
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